High speed, full surface, sub-micron flatness measurements
Corning manufactures a complete line of non-contact metrology instruments that measure surface form for flatness, parallelism, height, depth, surface finish, roughness or thickness, with sub-micron to nanometer accuracy in just seconds. Our systems are designed to operate in a wide range of environments, from the shop floor to the QC lab.
The Corning OEM Instruments group provides specialized value-added engineering and manufacturing services. For over 30 years, we’ve provided robust measurement solutions for the semiconductor industry. We provide highly specialized expertise in optical, mechanical, electrical and software, systems integration, engineering, design and manufacturing solutions.
We serve the following markets: automotive, display, semiconductor, hydraulics, pneumatics, data storage, consumer electronics, and spectroscopy.
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Products
Tropel® Flatmaster®
Tropel® Flatmaster® Systems
Industry-leading performance of surface form measurements for precision-component manufacturers.
Industry-leading performance of surface form measurements for precision-component manufacturers.
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Tropel® FlatMaster® MSP
Tropel® FlatMaster® MSP Systems
A frequency stepping interferometer providing fast, accurate metrology for semiconductor wafers.
A frequency stepping interferometer providing fast, accurate metrology for semiconductor wafers.
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Tropel® UltraFlat™ System
Tropel® UltraFlat™ System
Delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications.
Delivers the lowest measurement uncertainty for ever-tightening mask flatness specifications.
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Tropel® Wafer Analysis
Tropel® Wafer Analysis Systems
Enables measurement of wafer substrates from 2” to 450 mm for many material types.
Enables measurement of wafer substrates from 2” to 450 mm for many material types.
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Tropel® FlatMaster® Roughness Tool
Tropel® FlatMaster® System Roughness Measurement Tool
This powerful tool suitable for production, quality control, or R&D applications measures a broad variety of materials and surface finishes.
This powerful tool suitable for production, quality control, or R&D applications measures a broad variety of materials and surface finishes.
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Tropel® Flatmaster® SAW
Tropel® Flatmaster® SAW System
Advanced optical measurement module for wafer flatness and thickness variation.
Advanced optical measurement module for wafer flatness and thickness variation.
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Tropel® UltraSort II
Tropel® UltraSort II
A fully automated wafer flatness metrology platform with customizable measurement components
A fully automated wafer flatness metrology platform with customizable measurement components
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Learn more about all of our
semiconductor manufacturing
capabilities from inspection
lenses to durable optical materials.
Learn more about all of our
semiconductor manufacturing
capabilities from inspection
lenses to durable optical materials.